Dr. Matti Knaapila
at Univ of Durham
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 November 2004 Paper
Matti Knaapila, Benjamin Lyons, Kaisa Kisko, Oliver Seeck, Joel Foreman, Ulla Vainio, Ritva Serimaa, Mika Torkkeli, Andrew Monkman
Proceedings Volume 5519, (2004) https://doi.org/10.1117/12.555823
KEYWORDS: Thin films, Polymers, Crystals, Annealing, X-rays, Reflectivity, Scattering, Grazing incidence, X-ray diffraction, Absorption

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