Nagamani Pathuri
at Univ of Dayton
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 April 2007 Paper
Proceedings Volume 6528, 65281B (2007) https://doi.org/10.1117/12.716863
KEYWORDS: Atomic force microscopy, Microscopy, Acoustics, Ultrasonics, Ion beams, Visualization, Scanning probe microscopy, Nondestructive evaluation, Ultrasonography, Silicon

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