Dr. Niek F. Van Hulst Profile

Dr. Niek F. Van Hulst

Senior Group Leader / ICREA Professor at ICFO - Institut de Ciències Fotòniques

SPIE Involvement:

Author

Proceedings Article | 18 June 2024 Presentation

Paving the road to femtosecond 3D imaging with ultrabroadband tomography

Martin Hörmann, Franco V.A. Camargo, Niek F. van Hulst, Giulio Cerullo, Matz Liebel

Proceedings Volume PC12996, PC129960T (2024) https://doi.org/10.1117/12.3028604

KEYWORDS: Ultrafast imaging, Ultrafast phenomena, Stereoscopy, Optical tomography, Diffraction, Holography, Biological imaging, Wavefronts, Tomography, Spectroscopy

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Proceedings Article | 23 April 2008 Paper

Spectroscopic TPL imaging of gold nano-antennas

Petru Ghenuche, Sudhir Cherukulappurath, Tim Taminiau, Niek van Hulst, Romain Quidant

Proceedings Volume 6988, 698805 (2008) https://doi.org/10.1117/12.780751

KEYWORDS: Antennas, Gold, Spectroscopy, Near field scanning optical microscopy, Metals, Imaging spectroscopy, Near field optics, Microscopy, Luminescence, Electromagnetism

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Proceedings Article | 7 July 2005 Paper

Engineered plasmon focusing on functional gratings

B. van den Bergen, H. Offerhaus, N. van Hulst

Proceedings Volume 5840, (2005) https://doi.org/10.1117/12.608298

KEYWORDS: Plasmons, Fourier transforms, Modulation, Gold, Surface plasmons, Polarization, Sensors, Prisms, Metals, Reflection

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Proceedings Article | 24 September 1997 Paper

Optimization of LPCVD silicon oxynitride growth to large refractive index homogeneity and layer thickness uniformity

Kerstin Woerhoff, Paul Lambeck, H. Albers, Oscar Noordman, Niko van Hulst, Th. Popma

Proceedings Volume 3099, (1997) https://doi.org/10.1117/12.281235

KEYWORDS: Refractive index, Silicon, Low pressure chemical vapor deposition, Protactinium, Semiconducting wafers, Waveguides, Silicon films, Prisms, Thin films, Birefringence

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Proceedings Article | 6 September 1995 Paper

Probing field distributions on waveguide structures with an atomic force/photon scanning tunneling microscope

E. Borgonjen, Marco Moers, A. Ruiter, Niko van Hulst

Proceedings Volume 2535, (1995) https://doi.org/10.1117/12.218697

KEYWORDS: Waveguides, Integrated optics, Scanning tunneling microscopy, Near field optics, Atomic force microscopy, Head, Time multiplexed optical shutter, Photonic microstructures, Microfabrication, Silicon

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Proceedings Article | 6 September 1995 Paper

Fluorescence scanning near-field optical microscopy in reflection

Alain Jalocha, Marco Moers, Niko van Hulst

Proceedings Volume 2535, (1995) https://doi.org/10.1117/12.218694

KEYWORDS: Luminescence, Near field scanning optical microscopy, Polarization, Near field optics, Glasses, Reflection, Polymers, Optical microscopy, Aluminum, Absorption

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Proceedings Article | 6 September 1995 Paper

Biological applications of near-field scanning optical microscopy

Marco Moers, A. Ruiter, Alain Jalocha, Niko van Hulst, W. Kalle, J. Wiegant, A. Raap

Proceedings Volume 2535, (1995) https://doi.org/10.1117/12.218686

KEYWORDS: Luminescence, Near field scanning optical microscopy, Near field optics, Near field, Optical fibers, Image filtering, Diffraction, Optical microscopy, Microscopy, Biomedical optics

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Proceedings Article | 4 June 1993 Paper

Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operation

Constant Putman, Kees van der Werf, Bart de Grooth, Niko van Hulst, Jan Greve

Proceedings Volume 1855, (1993) https://doi.org/10.1117/12.146378

KEYWORDS: Atomic force microscopy, Microscopes, Atomic force microscope, Liquids, Optical microscopes, Semiconductor lasers, Polymers, Luminescence, Objectives, Sensors

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Proceedings Article | 1 May 1992 Paper

New imaging mode in atomic-force microscopy based on the error signal

Constant Putman, Kees van der Werf, Bart de Grooth, Niko van Hulst, Jan Greve, Paul Hansma

Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58191

KEYWORDS: Spatial frequencies, Feedback loops, Linear filtering, Particles, Atomic force microscopy, Error analysis, Scanning probe microscopy, Electronic filtering, Microscopy, Raster graphics

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Proceedings Article | 1 May 1992 Paper

Operation of a scanning near-field optical microscope in reflection in combination with a scanning force microscope

Niko van Hulst, Marco Moers, Oscar Noordman, T. Faulkner, F. Segerink, Kees van der Werf, Bart de Grooth, Bouwe Bolger

Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58190

KEYWORDS: Near field scanning optical microscopy, Microscopes, Near field optics, Atomic force microscopy, Reflection, Optical microscopes, Scanning probe microscopy, Compact discs, Semiconductor lasers, Image resolution

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Proceedings Article | 1 May 1992 Paper

Chromosome structure investigated with the atomic-force microscope

Bart de Grooth, Constant Putman, Kees van der Werf, Niko van Hulst, Geeske van Oort, Jan Greve

Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58188

KEYWORDS: Atomic force microscopy, Microscopes, Optical microscopes, Image resolution, Scanning electron microscopy, Atomic force microscope, Scanning probe microscopy, Integrated optics, Luminescence, Proteins

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Proceedings Article | 1 March 1991 Paper

Linear and nonlinear optical properties of substituted pyrrolo[1,2-a]quinolines

Niko van Hulst, Gerard Heesink, Bouwe Bolger, E. Kelderman, W. Verboom, David Reinhoudt

Proceedings Volume 1361, (1991) https://doi.org/10.1117/12.24421

KEYWORDS: Crystals, Nonlinear crystals, Molecules, Polarization, Organic materials, Optoelectronic devices, Single crystal X-ray diffraction, Quartz, Thin films, X-ray diffraction

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Proceedings Article | 1 February 1991 Paper

Second harmonic generation of diode laser radiation in KNbO3

Niko van Hulst, Gerard Heesink, H. de Leeuw, Bouwe Bolger

Proceedings Volume 1362, (1991) https://doi.org/10.1117/12.24571

KEYWORDS: Semiconductor lasers, Crystals, Phase modulation, Optoelectronic devices, Second-harmonic generation, Pulsed laser operation, Physics, Laser crystals, Continuous wave operation, Copper

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Showing 5 of 13 publications

Conference Committee Involvement (15)

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XXI

20 August 2023 | San Diego, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XX

21 August 2022 | San Diego, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIX

1 August 2021 | San Diego, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVIII

24 August 2020 | Online Only, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVII

11 August 2019 | San Diego, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVI

19 August 2018 | San Diego, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XV

6 August 2017 | San Diego, California, United States

Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XIV

28 August 2016 | San Diego, California, United States

SPIE Micro+Nano Materials, Devices, and Systems

7 December 2015 | Sydney, New South Wales, Australia

Plasmonics: Metallic Nanostructures and Their Optical Properties XIII

9 August 2015 | San Diego, California, United States

Plasmonics: Metallic Nanostructures and Their Optical Properties XII

17 August 2014 | San Diego, California, United States

Plasmonics: Metallic Nanostructures and Their Optical Properties XI

25 August 2013 | San Diego, California, United States

Plasmonics: Metallic Nanostructures and Their Optical Properties X

12 August 2012 | San Diego, California, United States

Photonic Materials, Devices, and Applications

2 May 2007 | Maspalomas, Gran Canaria, Spain

Photonic Materials, Devices, and Applications

9 May 2005 | Sevilla, Spain

Showing 5 of 15 Conference Committees

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