Mr. Oliver Boomhower Profile

Oliver Boomhower

at GE Research

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 30 August 2019 Paper

Silicon Fresnel lens fabricated using greyscale lithography

Cheng-Po Chen, Jason Karp, Tim Toepfer, Oliver Boomhower, Jim Kretchmer, Shubhodeep Goswami, Sachin Dekate, Loucas Tsakalakos

Proceedings Volume 11104, 111040G (2019) https://doi.org/10.1117/12.2530649

KEYWORDS: Etching, Collimation, Silicon, Semiconductor lasers, Lens design, Grayscale lithography, Fresnel lenses, Photoresist materials, Scanning electron microscopy, Tolerancing

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years