Piotr Knyps
at Institute of Microelectronics and Photonics
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 6 November 2019 Paper
Proceedings Volume 11176, 111764K (2019) https://doi.org/10.1117/12.2533912
KEYWORDS: Molybdenum, Raman spectroscopy, Aluminum, Chemical vapor deposition, Sapphire, Oxygen, Ions, Graphene, Mass spectrometry, Microelectronics

Proceedings Article | 6 November 2019 Paper
Piotr Caban, Marek Wojcik, Jaroslaw Gaca, Piotr Knyps, Dominika Teklinska, Ewa Dumiszewska
Proceedings Volume 11176, 111764Z (2019) https://doi.org/10.1117/12.2536751
KEYWORDS: Aluminum nitride, Gallium nitride, Field effect transistors, Etching, X-rays

Proceedings Article | 22 December 2016 Paper
Proceedings Volume 10175, 1017518 (2016) https://doi.org/10.1117/12.2263185
KEYWORDS: Gallium arsenide, Solar cells, Gold, Epitaxial lateral overgrowth, Indium gallium phosphide, Multijunction solar cells, Polymers, Copper, Polymer thin films, Semiconducting wafers

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