Silicon photonics is now considered the photonics platform of choice for short-reach data center single mode pluggable transceivers. With the emergence of co-packaged optics concepts, it can also enable high performance computing with power-efficient interconnect, but also Lidar system integration or even optical quantum computing. In this paper we will present an overview of what can be achieved in state-of-the-art silicon photonics platforms and we will discuss some of the emerging technology trends. In particular, we will discuss the integration of LPCVD SiN in an active silicon photonics platform.
On a Silicon Photonics integrated circuit, information is carried by the light that propagates within silicon waveguides. The waveguide’s geometry determines the functionality. The curvilinearity of Silicon Photonics designs would raise challenges for the manufacturability. However, so far Silicon Photonics design dimensions are considered relaxed by the industry. Also, the type of shapes that are drawn would generally use rather simple geometry objects. This allows the usage of conventional techniques in the different phases of the manufacturability. Recently has emerged a type of Silicon Photonics design, referred to as “inverse design”. This new technique produces designs that are very exotic and quite unpredictable. It shows complex geometries which critical dimensions require innovative Resolution Enhancement Techniques at the different stages of the Optical Proximity Correction flow. The success of these “inverse designs” relies on a very accurate pattern fidelity. This presentation will demonstrate a flow going from modelling, to OPC and metrology and verification of the manufactured wafer data. This flow permits to tackle the challenges brought newly to the Silicon Photonics environment.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.