In this paper, a ratiometric wavelength monitor at around 1550 nm based on the passive Silicon-on-Insulator (SOI) integrated device is proposed, theoretically investigated and fabricated. This monitor is made of a single Mach-Zehnder Interferometer (MZI) with direction coupler acting as edge filter. The ouput spectral response is designed to be ‘X-type’. The device shows a resolution of better than 0.4 nm over the wavelength range from 1505 nm to 1585 nm with a discrimination range of 30.5 dB from 15.5 dB to -15dB, which is suitable for wavelength measurement. Based on the single mode principle, the waveguide has a 220 nm×500 nm cross section for TM-polarized mode, and the total chip size is only 18 um×20 um. In conclusion, this proposed ratiometric wavelength monitor based on a single Mach-Zehnder Interferometer on SOI platform can realize the excellent resolution over large wavelength range.
We experimentally demonstrate a 8×8, 200 GHz cyclic AWG router using silicon oxynitride waveguides. The relative refractive index difference between the core and cladding layers is 9.75%. The output spectral response when light of TM polarization is input from the central input channel shows the central channel loss, non-uniformity and crosstalk are -1.51 dB, 2.23 dB, and -19 dB, respectively. And when light is input from the edge input channel, the central channel loss, non-uniformity and crosstalk are -3.68 dB, 2.38 dB, and -19 dB, respectively. Crosstalks vary from -19 dB to -21 dB for all channels. The device is polarization sensitive and a polarization dependent wavelength shift occurs in the spectral response of each output channel. The central wavelengths from central input channel to central output channel for the TE and TM polarization are 1553.8 nm and 1550.2 nm.
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