Dr. Tobias Bonhoff Profile
Dr. Tobias Bonhoff
at Aixemtec GmbH
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 4 March 2022 Presentation + Paper
M. Baumann, M. Ackermann, A. Balck, T. Bonhoff, O. Botter, R. Lange, S. Marfels, D. Dinakaran, A. Kösters, V. Krause, B. Emde, S. Zimbelmann, J. Hermsdorf, S. Kaierle, T. Heusinger von Waldegge
Proceedings Volume 11983, 119830O (2022) https://doi.org/10.1117/12.2615623
KEYWORDS: Semiconductor lasers, Multiplexing, Optical fibers, Polarization, Laser applications, Continuous wave operation, High power lasers, Blue light emitting diodes

Proceedings Article | 15 February 2018 Paper
Tobias Bonhoff, Jochen Stollenwerk, Peter Loosen
Proceedings Volume 10525, 1052504 (2018) https://doi.org/10.1117/12.2288190
KEYWORDS: Thermal effects, Finite element methods, Wave propagation, Systems modeling, Thermal modeling, High power lasers, Laser applications, Dispersion

Proceedings Article | 23 September 2015 Paper
Tobias Bonhoff, Lasse Büsing, Jochen Stollenwerk, Peter Loosen
Proceedings Volume 9626, 96261V (2015) https://doi.org/10.1117/12.2190879
KEYWORDS: Finite element methods, Thermal modeling, Aspheric lenses, Systems modeling, Refractive index, Data modeling, GRIN lenses, Thermography, Diffraction, Thermal effects

Proceedings Article | 6 March 2014 Paper
Proceedings Volume 8968, 89680W (2014) https://doi.org/10.1117/12.2040306
KEYWORDS: Semiconducting wafers, Silicon, Gallium arsenide, Semiconductors, Semiconductor lasers, Laser processing, Transparency, Absorption, Pulsed laser operation, Scanning electron microscopy

Proceedings Article | 6 March 2014 Paper
Proceedings Volume 8970, 89700R (2014) https://doi.org/10.1117/12.2040049
KEYWORDS: Femtosecond phenomena, Spatial light modulators, Picosecond phenomena, Surface roughness, Additive manufacturing, Manufacturing, Computer aided design, Laser processing, Metals, Particles

Proceedings Article | 9 March 2013 Paper
Proceedings Volume 8612, 861207 (2013) https://doi.org/10.1117/12.2004878
KEYWORDS: Silicon, Semiconductor lasers, Semiconducting wafers, Oscillators, Laser ablation, Pulsed laser operation, Laser damage threshold, Laser applications, Laser systems engineering, Optical parametric oscillators

Showing 5 of 6 publications
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