Structured LED materials such as micro/nanowires are highly promising as they enable superior light outcoupling, tunable directionality and have a small footprint for demanding display applications. In such nanostructured devices, individual electrical contacting and analysis is a tedious and complicated process. Spatially-resolved cathodoluminescence (CL) spectroscopy, in which the electron-beam-induced radiation is collected inside an electron microscope, holds great potential for contactless nanoscale optoelectronic material inspection of semiconductor materials. Conventionally, CL experiments focused on measuring the intensity and spectral content of the light but recently there have been several relevant advancements in the CL technique. Here, we will describe some of those developments.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.