Yajun Wu
at Hubei University Of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2016 Paper
Proceedings Volume 9903, 99030G (2016) https://doi.org/10.1117/12.2211239
KEYWORDS: Phase shifts, Digital Light Processing, Charge-coupled devices, 3D metrology, Error analysis, Phase shift keying, 3D applications, Projection systems, Phase measurement, Image analysis

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