Ye Cao
at Phlux Technology Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 June 2024 Presentation + Paper
Proceedings Volume 13025, 1302503 (2024) https://doi.org/10.1117/12.3014267
KEYWORDS: Avalanche photodetectors, Receivers, Photons, Dark current, Laser damage threshold, Fast overload recovery, Avalanche photodiodes, Single photon avalanche diodes

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