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Zhe Si
at Shanghai Institute of Optics and Fine Mechanics
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Publications (1)
Proceedings Article | 5 November 2018 Paper
An all-reflective transient-grating based self-referenced spectral interferometry device for few-cycle laser pulses characterization
Proceedings Volume 10811, 1081119 (2018) https://doi.org/10.1117/12.2502612
KEYWORDS: Phase measurement, Femtosecond lasers, Femtosecond phenomena, Interferometry, Laser systems engineering, Laser interferometry, Physics, Pulsed laser operation, Ultraviolet radiation
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