Dynamical study of thermal conductivity of nanostructured layers by use of the photoinduced transient thermoelectric effect

N. Samuolienė; J. Gradauskas; A. Sužiedėlis; A. Maneikis; M. Treideris

doi:10.1117/12.2083576

22 October 2014 Dynamical study of thermal conductivity of nanostructured layers by use of the photoinduced transient thermoelectric effect

N. Samuolienė, J. Gradauskas, A. Sužiedėlis, A. Maneikis, M. Treideris

Author Affiliations +

Proceedings Volume 9421, Eighth International Conference on Advanced Optical Materials and Devices (AOMD-8); 94210C (2014) https://doi.org/10.1117/12.2083576
Event: Eighth International Conference on Advanced Optical Materials and Devices, 2014, Riga, Latvia

Abstract

We propose a new fast technique to determine thermal conductivity of a nanostructured material and demonstrate it for porous silicon. Transient thermoelectric voltage is measured after a pulsed laser irradiation, and analysis of the voltage decay time constant and porosity of the structure gives the value of the thermal conductivity. For n-type Si of 70% porosity we obtain the value of 35 W m^-1 K^-1 what is in good agreement with the results of other investigations The method can be easily applied for any other porous or otherwise structured low-dimensional materials.

Citation Download Citation

N. Samuolienė, J. Gradauskas, A. Sužiedėlis, A. Maneikis, and M. Treideris "Dynamical study of thermal conductivity of nanostructured layers by use of the photoinduced transient thermoelectric effect", Proc. SPIE 9421, Eighth International Conference on Advanced Optical Materials and Devices (AOMD-8), 94210C (22 October 2014); https://doi.org/10.1117/12.2083576

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