CONFERENCE PROCEEDINGS
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Franz Rinner
at Fraunhofer IAF
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 19 June 2003 Paper
Analysis of heat flows and their impact on the reliability of high-power diode lasers
Jens Tomm, Franz Rinner, Joseph Rogg, E. Thamm, Christian Ribbat, Roman Sellin, Dieter Bimberg
Proceedings Volume 4993, (2003) https://doi.org/10.1117/12.473277
KEYWORDS: Semiconductor lasers, High power lasers, Temperature metrology, Quantum wells, Pulsed laser operation, Continuous wave operation, Reliability, Raman spectroscopy, Waveguides, Gallium
Proceedings Article | 11 March 2003 Paper
High-brightness 1040-nm tapered diode lasers
Marc Kelemen, Juergen Weber, Franz Rinner, Joseph Rogg, Michael Mikulla, Guenter Weimann
Proceedings Volume 4947, (2003) https://doi.org/10.1117/12.468634
KEYWORDS: Semiconductor lasers, Continuous wave operation, Diffraction, Reflectivity, Fiber amplifiers, High power lasers, Waveguides, Optical amplifiers, Laser video displays
Proceedings Article | 16 April 2002 Paper
High-power high-brightness ridge-waveguide tapered diode lasers at 940 nm
Marc Kelemen, Franz Rinner, Joseph Rogg, Nicolas Wiedmann, Rudolf Kiefer, Martin Walther, Michael Mikulla, Guenter Weimann
Proceedings Volume 4648, (2002) https://doi.org/10.1117/12.462644
KEYWORDS: Semiconductor lasers, High power lasers, Diffraction, Optical amplifiers, Optical pumping, Fiber amplifiers, Quantum wells, Mirrors, Reliability, Continuous wave operation
Proceedings Article | 16 April 2002 Paper
Carrier density dependence of the lifetime of InGaAs/AlGaAs high-power lasers
Franz Rinner, Joseph Rogg, Nicolas Wiedmann, H. Konstanzer, Michael Dammann, Michael Mikulla, Reinhart Poprawe, Guenter Weimann
Proceedings Volume 4648, (2002) https://doi.org/10.1117/12.462643
KEYWORDS: Quantum wells, Waveguides, Mirrors, Temperature metrology, Diffusion, High power lasers, Gallium, Semiconductor lasers, Laser damage threshold, Aluminum
Proceedings Article | 6 June 2001 Paper
High-brightness laser diodes using angular filtering by total reflection
Joseph Rogg, Konstantin Boucke, Marc Kelemen, Franz Rinner, Wilfried Pletschen, Rudolf Kiefer, Martin Walther, Michael Mikulla, Reinhart Poprawe, Guenter Weimann
Proceedings Volume 4287, (2001) https://doi.org/10.1117/12.429801
KEYWORDS: Semiconductor lasers, Mirrors, Optical filters, Near field, High power lasers, Reflectivity, Diffusion, Refractive index, Reflection, Solids
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