PROCEEDINGS VOLUME 2349
PHOTONICS FOR INDUSTRIAL APPLICATIONS | 31 OCTOBER - 4 NOVEMBER 1994
Industrial Optical Sensors for Metrology and Inspection
Editor Affiliations +
IN THIS VOLUME

4 Sessions, 31 Papers, 0 Presentations
PHOTONICS FOR INDUSTRIAL APPLICATIONS
31 October - 4 November 1994
Boston, MA, United States
Sensors and Measurement Technology
Omer L. Hageniers
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198670
Kris Muthukrishnan
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198681
Juha Roening, Alexander Korzun, Jukka P. Riekki
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198696
Bao Hua Zhuang, Ji-Hua Zhang, Chengzhi Jiang, Zhen Li, Wenwei Zhang
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198697
Kayode A. Ayandokun, P. A. Orton, Nasser Sherkat, Peter D. Thomas
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198698
Hajime Nakajima, Masahiro Shikai, Kazuo Takashima, Teruo Usami
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198699
Yukio Ikeda, Toshiya Yuhara, Tatsuya Kumagai, Hirokazu Soekawa, Hiroshi Kajioka
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198700
Interferometry Methods and Applications
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198671
Lisa Bird
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198672
Karl A. Stetson
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198673
George Eugene Dovgalenko, Yuri I. Onischenko, Irina I. Loutchkina, Gregory J. Salamo
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198674
C. Liao, Michael A. Fiddy
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198675
Kenneth T. V. Grattan, Yanong N. Ning, Q. Wang, Yueai Liu, Andrew W. Palmer
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198676
Umberto Minoni, Enea Gelmini, Franco Docchio, Umberto U. Perini
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198677
E. Mainsah, Weiping P. Dong, Tim King
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198678
Ji-Hua Zhang, Bao Hua Zhuang, Shao-Qing Wang
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198679
Alexander V. Shelyakov, Yuri I. Rzhavin
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198680
Process Control Applications
Peter T. Waltenberg, Peter J. Hilton
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198682
Wolfram Kleuver, Lothar Becker
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198683
Wayne S. Hill, Michael Snowbell
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198684
Zhongjing Ren, Yuanhai Wu, Pingji Xu
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198685
Shou-Bin Liu, Hui-Fen Yu
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198686
Poster Session
Josef Mandak
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198687
Michael Biebricher, Peter Schulz, Michael Rickers, Hilmar Franke
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198688
Xiaoyang Yu, Yi-Jian Shen, Qi-Shan Wang
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198689
Jarmo T. Alander, Mikko Huusko, Aimo Karonen, Jari Kuusrainen, Lars Unonius
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198690
Colin J. Taylor, Ethan Evans, John M. Dolan, Pradeep K. Khosla
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198691
Fengzhou Fang, Y. Q. Zhang, Feihu Zhang, Shen Dong, Zhe-Jun Yuan
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198692
Sergey L. Vinogradov, Vitaly E. Shubin
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198693
Hui-Fen Yu, Shou-Bin Liu, Ke-Jun Xiang
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198694
Interferometry Methods and Applications
Proceedings Volume Industrial Optical Sensors for Metrology and Inspection, (1995) https://doi.org/10.1117/12.198695
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