Optical, electrical, and microstructural properties of thermally evaporated Cr thin films assisted by the low-energy Ar ion beam were investigated. The result shows that the optical and electrical properties are close to those of the corresponding bulk Cr: both refractive index and extinction coefficient increase, reflectance increases, and electrical resistivity decreases. The tensile stress decreases while the grain size changes slightly. From this experimental study, it is found that the low-energy Ar ion beam bombardment on growing Cr films modifies the microstructure of Cr films to improve the optical and electrical properties.
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