Theoretical investigation for improvement of scanning a near-field optical microscope

Anatoly S. Lapchuk; Andrey A. Kryuchin

doi:10.1117/12.451711

11 November 2002 Theoretical investigation for improvement of scanning near-field optical microscope

Proceedings Volume 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components; (2002) https://doi.org/10.1117/12.451711
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

A near-field optical microscope on the basis of two trapeziform metallic strips on the surface of a dielectric cone is investigated¹. It is shown that such construction of a near-field probe significantly improved the optical efficiency of a near-field microscope. The field distribution in the vicinity of probe apex is investigated for this probe and for the usual SNOM probe. On the basis of mathematical simulation it was shown that this type of a near-field microscope is promising for use in optical information recording with pit length less than 200 nm and also for using as optical heating element in magnetic information recording. The construction of a near field microscope for information recording is proposed on the basis of this near-field microscope and a solid immersion lens². The model of a near field strips probe with cleaved apex is proposed. A method of checking the distance between a probe and the surface on the basis of exciting mechanical vibration of cleaved apex by voltage step is offered. The oscillation amplitude and their attenuation are determined by measuring high-frequency electromagnetic oscillation, which are excited by oscillation of opposite charges at the apex of a probe. The investigation was carried out on the basis of a mathematical model and an experiment is needed for full investigation.

Citation Download Citation

Anatoly S. Lapchuk and Andrey A. Kryuchin "Theoretical investigation for improvement of scanning near-field optical microscope", Proc. SPIE 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, (11 November 2002); https://doi.org/10.1117/12.451711

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available