Dr. Byung-Kyu Lee
at SAMSUNG Advanced Institute of Technology
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 10 October 2023 Presentation + Paper
Proceedings Volume 12687, 1268709 (2023) https://doi.org/10.1117/12.2674111
KEYWORDS: Long wavelength infrared, Deep learning, Image restoration, Image sensors, Image quality, Modulation transfer functions, Modulation, Image sharpness, Imaging systems, Optical metamaterials

Proceedings Article | 14 October 2011 Paper
Duhyun Lee, Byung-Kyu Lee, Woong Ko, Jae-Kwan Kim, Kiyeon Yang, Byounghoon Seung, Ilyong Jang, Mun Ja Kim, Byunggook Kim, ChangMin Park, Jeongho Yeo, Changyoul Moon
Proceedings Volume 8166, 81661U (2011) https://doi.org/10.1117/12.898747
KEYWORDS: Quartz, Silicon, Etching, Nanoimprint lithography, Chromium, Oxides, Photomasks, Line width roughness, Electron beam lithography, Semiconducting wafers

Proceedings Article | 3 April 2010 Paper
C. Park, K. Kim, Y. Lee, K. Cho, J. Park, In Kim, J. Yeo, S. Choi, D. Lee, B. Lee, S. Hwang
Proceedings Volume 7637, 76371R (2010) https://doi.org/10.1117/12.846481
KEYWORDS: Nanoimprint lithography, Semiconducting wafers, Electron beam lithography, Lithography, Line width roughness, Etching, Photomasks, Silicon, Optical lithography, Quartz

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