Dr. Elena Ermilova
at Bundesanstalt für Materialforschung und -prüfung
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 June 2024 Poster + Paper
Proceedings Volume 13013, 1301309 (2024) https://doi.org/10.1117/12.3015281
KEYWORDS: Refractive index, Data modeling, X-rays, Near infrared, Mirrors, Astronomy, Spectroscopic ellipsometry, Reflection

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