Joyce A. Lowes
at Brewer Science Inc
SPIE Involvement:
Author
Publications (19)

Proceedings Article | 9 April 2024 Presentation + Paper
Si Li, Xinlin Lu, Stephen Grannemann, Daniel Sweat, Kelsey Brakensiek, Pengtao Lu, Joyce Lowes, Vandana Krishnamurthy, Veerle Van Driessche, Douglas Guerrero
Proceedings Volume 12957, 1295715 (2024) https://doi.org/10.1117/12.3010887
KEYWORDS: Polymers, Film thickness, Lithography, Extreme ultraviolet lithography, Semiconducting wafers, Coating, Tin, Silicon, Diffusion

Proceedings Article | 9 April 2024 Poster + Paper
Proceedings Volume 12957, 129571T (2024) https://doi.org/10.1117/12.3010498
KEYWORDS: Polymers, Extreme ultraviolet lithography, Line width roughness, Lithography, Adhesives, Adhesion, Extreme ultraviolet

Proceedings Article | 1 May 2023 Presentation + Paper
Proceedings Volume 12498, 124980N (2023) https://doi.org/10.1117/12.2658529
KEYWORDS: Semiconducting wafers, Extreme ultraviolet lithography, Coating, Coating thickness, Silicon, Photoresist materials, Adhesion, Line width roughness, Resistance, Adhesives

Proceedings Article | 25 May 2022 Paper
Zhimin Zhu, Joyce Lowes, Shawn Ye, Zhiqiang Fan, Tim Limmer
Proceedings Volume 12055, 120550P (2022) https://doi.org/10.1117/12.2614289
KEYWORDS: Stochastic processes, System on a chip, Lithography, Extreme ultraviolet lithography, Diffusion, Optical lithography, Extreme ultraviolet, Photoresist processing, Printing, Optical imaging

Proceedings Article | 25 May 2022 Presentation + Paper
Proceedings Volume 12055, 120550A (2022) https://doi.org/10.1117/12.2610985
KEYWORDS: Extreme ultraviolet lithography, Adhesives, Polymers, Etching, Plasma etching, Optical lithography, Semiconducting wafers

Showing 5 of 19 publications
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