Dr. Lianxiang Yang
SDL Author at Oakland Univ
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Interferometry , Photogrammetry , Optical measurement , Laser NDT
Websites:
Publications (47)

SPIE Journal Paper | 9 April 2022 Open Access
OE, Vol. 61, Issue 06, 061401, (April 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.6.061401
KEYWORDS: Optical testing, Interferometry, Copper, Speckle pattern, Optical engineering, Manufacturing, Sensors, Precision measurement, Optics manufacturing, Nanoparticles

Proceedings Article | 7 March 2019 Paper
Jing Yang, Sijin Wu, Weixian Li, Fan Wu, Ji Liu, Lianxiang Yang
Proceedings Volume 11053, 1105343 (2019) https://doi.org/10.1117/12.2512422
KEYWORDS: Interferometry, Interferometers, Speckle pattern, Sensors, Optical interferometry, Mathematical modeling

SPIE Journal Paper | 13 July 2018
OE, Vol. 57, Issue 07, 074102, (July 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.7.074102
KEYWORDS: Digital image correlation, Injuries, Head, Optical spheres, Neck, Cameras, Optical engineering, Image processing, Spherical lenses, Baryon acoustic oscillations

SPIE Journal Paper | 15 June 2017
OE, Vol. 56, Issue 06, 066107, (June 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.6.066107
KEYWORDS: Speckle pattern, Interferometry, Imaging systems, System integration, Cameras, Speckle, Interferometers, Aluminum

Proceedings Article | 24 November 2016 Paper
Proceedings Volume 10023, 100231O (2016) https://doi.org/10.1117/12.2245973
KEYWORDS: Calibration, Corner detection, Cameras, Detection and tracking algorithms, Algorithms, Reconstruction algorithms, Inspection, Optoelectronics, Aerospace engineering, Manufacturing

Showing 5 of 47 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (11)
Optical Metrology and Inspection for Industrial Applications XII
11 October 2025 | Beijing, China
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Showing 5 of 11 Conference Committees
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