Dr. Mitsuhiro Ishihara
Electronics Unit at Takaoka Electric Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 August 2018 Presentation + Paper
Proceedings Volume 10749, 1074905 (2018) https://doi.org/10.1117/12.2319812
KEYWORDS: Confocal microscopy, Image acquisition, Semiconductors, Integrated circuits, Image processing, Edge detection, Image analysis, Reliability, Optical components, Photomasks

SPIE Journal Paper | 1 June 1999
Mitsuhiro Ishihara, Hiromi Sasaki
OE, Vol. 38, Issue 06, (June 1999) https://doi.org/10.1117/12.10.1117/1.602155
KEYWORDS: Confocal microscopy, Microscopes, Objectives, Inspection, Imaging systems, Image processing, Camera shutters, CCD image sensors, Image sensors, Semiconductors

Proceedings Article | 7 May 1999 Paper
Mitsuhiro Ishihara, Yasuo Nakazato, Hiromi Sasaki, Masahito Tonooka, Masayuki Yamamoto, Yukitoshi Otani, Toru Yoshizawa
Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347778
KEYWORDS: Phase measurement, Phase shifting, Objectives, Confocal microscopy, CCD cameras, Glasses, Systems engineering, Optics manufacturing, Manufacturing, Inspection

Proceedings Article | 30 June 1998 Paper
Mitsuhiro Ishihara, Hiromi Sasaki
Proceedings Volume 3478, (1998) https://doi.org/10.1117/12.312975
KEYWORDS: Confocal microscopy, Microscopes, 3D metrology, Objectives, Imaging systems, Inspection, Image processing, CCD image sensors, 3D image processing, Image sensors

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