Prof. Toru Yoshizawa
SPIE Involvement:
Conference Program Committee | Editor | Author
Publications (101)

Proceedings Article | 27 October 2021 Paper
Lianhua Jin, Takuma Ashizawa, Toru Yoshizawa
Proceedings Volume 11927, 119270A (2021) https://doi.org/10.1117/12.2616254

Proceedings Article | 10 October 2020 Presentation + Paper
Proceedings Volume 11552, 115520M (2020) https://doi.org/10.1117/12.2575305
KEYWORDS: Beam shaping, Optical testing, Image sensors, Light scattering, Opacity, Translucency, Sensors, Reflection, Laser scattering, Scattering

Proceedings Article | 2 November 2018 Paper
Lianhua Jin, Nobuto Miyatsu, Eiichi Kondoh, Bernard Gelloz, Naobumi Kanazawa, Toru Yoshizawa
Proceedings Volume 10819, 108190K (2018) https://doi.org/10.1117/12.2501027
KEYWORDS: Geometrical optics, Image filtering, Optical testing, Image processing, Optics manufacturing, Optical instrument design

Proceedings Article | 13 November 2014 Paper
Toshitaka Wakayama, Shun Hiratsuka, Yoshihisa Kamakura, Katsumasa Nakamura, Toru Yoshizawa
Proceedings Volume 9276, 92760G (2014) https://doi.org/10.1117/12.2072170
KEYWORDS: 3D metrology, Cancer, Fringe analysis, Stereoscopic cameras, Cameras, Oncology, Radiotherapy, Semiconductor lasers, Mirrors, Projection systems

Proceedings Article | 28 May 2014 Paper
Proceedings Volume 9110, 91100I (2014) https://doi.org/10.1117/12.2050892
KEYWORDS: Optical alignment, Ellipsometry, CCD cameras, Semiconductor lasers, Optics manufacturing, Mirrors, Receivers, Beam shaping, Spindles, Inspection

Showing 5 of 101 publications
Proceedings Volume Editor (26)

Showing 5 of 26 publications
Conference Committee Involvement (46)
Optical Technology and Measurement for Industrial Applications Conference
21 April 2025 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Applied Optical Metrology IV
4 August 2021 | San Diego, California, United States
Showing 5 of 46 Conference Committees
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