Dr. Shin Usuki Profile

Dr. Shin Usuki

Associate Professor at Shizuoka Univ

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Author

Publications (7)

Proceedings Article | 3 September 2019 Paper

Measurement of patterned surfaces with non-fluorescent structured illumination microscope

S. Usuki, G. Shibata, Kenjiro Miura

Proceedings Volume 11102, 111021L (2019) https://doi.org/10.1117/12.2529023

KEYWORDS: Microscopy, Image processing, Microscopes, Imaging systems, Diffraction, Image resolution, Speckle, Light sources, Michelson interferometers, Optical microscopes

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Proceedings Article | 18 August 2018 Paper

Object scanning scheme in wide-field low-coherence interferometry

S. Usuki, Kenjiro Miura

Proceedings Volume 10749, 1074917 (2018) https://doi.org/10.1117/12.2320381

KEYWORDS: Interferometry, Objectives, Interferometers, Light sources, Mirrors, Optical microscopy, 3D image processing, Microscopes, Imaging systems, Light emitting diodes

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Proceedings Article | 19 September 2017 Presentation + Paper

Forming intermediate spatial resolution of microscopy images for continuous zooming on multi-resolution processing system

Evan H. Putranto, Tomohiro Suzuki, Shin Usuki, Kenjiro T. Miura

Proceedings Volume 10396, 1039615 (2017) https://doi.org/10.1117/12.2273559

KEYWORDS: Microscopes, Microscopy, Scanning electron microscopy, Image processing, Spatial resolution, Zoom lenses, Optical microscopes, Electron microscopes, Image registration, Objectives

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Proceedings Article | 19 September 2017 Paper

Improving spatial resolution of the light field microscope with Fourier ptychography

Yoshitake Tani, Shin Usuki, Kenjiro Miura

Proceedings Volume 10410, 1041009 (2017) https://doi.org/10.1117/12.2273665

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Proceedings Article | 27 August 2010 Paper

Multiple image reconstruction for high-resolution optical imaging using structured illumination

S. Usuki, R. Kudo, S. Takahashi, K. Takamasu

Proceedings Volume 7800, 78000I (2010) https://doi.org/10.1117/12.861966

KEYWORDS: Spectral resolution, Image restoration, Diffraction, Digital imaging, Optical imaging, Diffraction gratings, Reconstruction algorithms, Charge-coupled devices, Point spread functions, Chemical elements

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Proceedings Article | 12 October 2006 Paper

Development of super-resolution optical inspection system for semiconductor defects using standing wave illumination shift

S. Usuki, H. Nishioka, S. Takahashi, K. Takamasu

Proceedings Volume 6375, 637508 (2006) https://doi.org/10.1117/12.690582

KEYWORDS: Super resolution, Light scattering, Particles, Scattering, Optical inspection, Semiconducting wafers, Inspection, Modulation, Semiconductors, Imaging systems

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Proceedings Article | 6 December 2005 Paper

Super-resolution optical inspection for semiconductor defects using standing wave shift

S. Usuki, H. Nishioka, S. Takahashi, K. Takamasu

Proceedings Volume 6049, 60490C (2005) https://doi.org/10.1117/12.648356

KEYWORDS: Scattering, Super resolution, Light scattering, Semiconductors, Diffraction, Optical inspection, Inspection, Charge-coupled devices, Semiconducting wafers, Image acquisition

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Showing 5 of 7 publications

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