Dr. Steven B. Fairchild Profile

Dr. Steven B. Fairchild

Senior Physicist at Air Force Research Lab

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 12 March 2018 Presentation + Paper

ToF-SIMS characterization of robust window material for use in diode pumped alkali lasers

Aaron Fletcher, David Turner, Steven Fairchild, Christopher Rice, Gregory Pitz

Proceedings Volume 10513, 105130L (2018) https://doi.org/10.1117/12.2286088

KEYWORDS: Rubidium, Diffusion, Alkali metals, Semiconductor lasers, Optical properties, Diodes, Absorption, Sapphire, Spinel, Crystals

Read Abstract +

Proceedings Article | 22 February 2017 Open Access

Laser stimulated grain growth in 304 stainless steel anodes for reduced hydrogen outgassing (Erratum)

D. Gortat, M. Sparkes, S. Fairchild, P. Murray, M. Cahay, T. Back, G. Gruen, N. Lockwood, W. O’Neill

Proceedings Volume 10083, 100832E (2017) https://doi.org/10.1117/12.2252094

KEYWORDS: High power microwaves, Laser energy, Continuous wave operation, Chemical species, Hydrogen, Metals, Laser processing, Electron beams, Fiber lasers, Diffusion, Vacuum tubes, Materials science

Read Abstract +

DOWNLOAD PAPER

Proceedings Article | 16 September 2015 Paper

Thermal instability of field emission from carbon nanotubes studied using multi-physics simulation by considering space charge effect

A. Islam, S. Fairchild, B. Maruyama

Proceedings Volume 9552, 95520B (2015) https://doi.org/10.1117/12.2187331

KEYWORDS: Carbon nanotubes, X-rays, Image enhancement, 3D modeling, Thermal modeling, Electron transport, Image processing, Computer simulations, Manufacturing, Analytical research

Read Abstract +

Proceedings Article | 25 October 2005 Paper

Interferometer-less surface profilerometer

Ponciano Rodriguez, Jose Lorenzo, Feng Jin, Sudhir Trivedi, Chen-Chia Wang, Nibir Dhar, Steven Fairchild

Proceedings Volume 6017, 60170C (2005) https://doi.org/10.1117/12.634483

KEYWORDS: Laser beam diagnostics, Sensors, Sapphire, Interferometers, Phase shifts, Distance measurement, Signal processing, Data modeling, Optics manufacturing, Doppler effect

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years