Peter Z. Takacs directs the activities of the Optical Metrology Laboratory in the Instrumentation Division of Brookhaven National Laboratory. He is actively involved in the development of instrumentation, methods, and standards used for testing the figure and finish of aspheric optics, such as those used for reflecting x-rays at grazing incidence, and in characterizing the performance of CCD sensors He received a BA from Rutgers University in 1969 and a PhD in physics from Johns Hopkins University in 1975.
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Prototype sensors and preproduction CCDs were delivered by vendors and they have been used for developing test procedures and protocols. Building upon this experience, two test stands were designed and commissioned at Brookhaven National Laboratory for production electro-optical testing.
In this article, the sensor acceptance criteria are outlined and discussed, the test stand design and used equipment are presented and the results from commissioning sensor runs are shown.
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