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Petra M. Schmitt
at CNES
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Author
Publications (1)
Proceedings Article | 23 December 2003 Paper
Reliability issues of an accelerometer under environmental stresses
Petra Schmitt, Francis Pressecq, Guy Perez, Xavier Lafontan, Jean Marc Nicot, Daniel Esteve, Jean Yves Fourniols, Henri Camon, Coumar Oudea
Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.524575
KEYWORDS: Microelectromechanical systems, Reliability, Commercial off the shelf technology, Finite element methods, 3D modeling, Physics, Failure analysis, Profilometers, Capacitance, Material characterization
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