In this presentation, the authors will review the next generation light source with improvement in speckle reduction for improved device performance yield in next generation device nodes. Further improvements in local critical dimension uniformity (LCDU) from improvement optics that significantly reduces speckle. Overall system availability continues to increase due to significant improvements in module lifetimes which continue to contribute to productivity improvements. We continue to focus on reducing the environmental impact through the reduction and eventual elimination of helium gas which reduces supply issue risks. Lastly, we continue to focus on technology improvements that reduces energy consumption to reduce cost and ecological impact.
Key sustainability opportunities have been executed in support of corporate initiatives to reduce the environmental footprint and decrease the running cost of DUV light sources. Previously, substantial neon savings were demonstrated over several years through optimized gas management technologies. Beyond this work, Cymer is developing the XLGR 100, a self-contained neon recycling system, to enable minimal gas consumption. The high efficiency results of the XLGR 100 in a production factory are validated in this paper.
Cymer has also developed new light source modules with 33% longer life in an effort to reduce raw and associated resource consumption. In addition, a progress report is included regarding the improvements developed to reduce light source energy consumption.
Cymer continues to address several areas of sustainability within the semiconductor industry by reducing or eliminating consumption of power and specific types of gas (i.e. neon, helium) required by DUV light sources in order to function. Additionally, Cymer introduced a new recycling technology to reduce the dependence on production of raw gases. In this paper, those initiatives that reduce the operational cost, environmental footprint, and business continuity risk will be discussed.
Cymer has increased the efficiency of its light sources through improvements that have resulted in energy output increase while maintaining the same or requiring less power consumption. For both KrF and ArF systems, there have been component [1], system, and architecture improvements [2] that allowed customers to increase energy efficiency and productivity. An example of module improvements is the latest MO chamber that helped reduce power consumption by ~15%. Future improvements aim to continue reducing the power consumption and cost of operation of the install base and new systems.
The neon supply crisis in 2015 triggered an intensive effort by the lithography light source suppliers to find ways to minimize the use of neon, a main consumable of the light source used in DUV photolithography. Cymer delivered a multi-part support program to reduce natural resource usage, decrease overall cost of operation, and ensure that chipmaker’s business continuity risk is minimized. The methods used to minimize the use of neon for 248 nm and 193 nm photolithography that offered significant relief from supply constraints and reduction of business continuity risk for chipmakers were described in previous work [3]. In this paper, results from the program will be presented.
In addition, techniques to capture the neon effluent and re-purify it within the semiconductor fabs have been pursued. For example, Cymer has developed and validated a neon recycling system for ArF light sources that resides within the chipmaker’s fab. Cymer has partnered with a global gas supplier to develop a system capable of capturing, recycling and delivering <90% of the total neon gas required by multiple ArF light sources through automated operation, including online analysis. In this paper, the neon recycle system performance as demonstrated by a quantitative analysis of facility-supplied gas versus the recycled neon in ArF light source performance will be discussed.
Similarly, DUV light sources have historically used helium as a purge gas in the critical line narrowing module (LNM) to achieve stable wavelength and bandwidth control. Helium has a low coefficient of index of refraction change vs. temperature relative to nitrogen and provides efficient cooling and purging of critical optics in the LNM. Previous work demonstrated how helium consumption can be reduced and still achieve stable performance under all operating conditions [1]. In this paper, results of eliminating the use of helium will be described.
Light source technological performance is key to enabling chipmaker yield and production success. Just as important is ensuring that performance is consistent over time to help maintain as high an uptime as possible on litho-cells (scanner and track combination). While it is common to see average tool uptime of over 99% based on service intervention time, we will show that there are opportunities to improve equipment availability through a multifaceted approach that can deliver favorable results and significantly improve on the actual production efficiency of equipment.
The majority of chipmakers are putting light source data generated by tools such as Cymer OnLine (COL), OnPulse Plus, and SmartPulse to good use. These data sets, combined with in-depth knowledge of the equipment, makes it possible to draw powerful conclusions that help increase both chip manufacturing consistency as well as equipment productivity. This discussion will focus on the latter, equipment availability, and how data analysis can help increase equipment availability for Cymer customers.
There are several types of opportunities for increasing equipment availability, but in general we can focus on two primary categories: 1) scheduled downtime and 2) unscheduled downtime. For equipment that is under control of a larger entity, as the laser is to the scanner, there are additional categories related to either communication errors or better synchronization of events that can maximize overall litho-cell efficiency. In this article we will focus on general availability without highlighting the specific cause of litho-cell (laser, scanner and track). The goal is to increase equipment available time with a primary focus is on opportunities to minimize errors and variabilities.
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