Prof. Zonghua Zhang
Professor at Hebei Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (51)

Proceedings Article | 20 November 2024 Paper
Proceedings Volume 13241, 1324115 (2024) https://doi.org/10.1117/12.3033210
KEYWORDS: Beam splitters, Refraction, Mirror surfaces, Reflection, Mirrors, Error analysis, Refractive index, Calibration, Photovoltaics, Cameras

Proceedings Article | 27 November 2023 Paper
Proceedings Volume 12769, 127690K (2023) https://doi.org/10.1117/12.2686345
KEYWORDS: Beam splitters, Reflection, Phase measurement, Deflectometry, Optical testing, Specular reflections, Imaging systems, Shadows, Optical surfaces, Optical simulations

Proceedings Article | 9 October 2021 Paper
Proceedings Volume 11899, 1189909 (2021) https://doi.org/10.1117/12.2600851
KEYWORDS: Specular reflections, Mirrors, LCDs, Fringe analysis, Cameras, 3D metrology, Calibration, Deflectometry

Proceedings Article | 20 June 2021 Presentation + Paper
Proceedings Volume 11786, 117861H (2021) https://doi.org/10.1117/12.2593872
KEYWORDS: Deflectometry, Mirrors, Clouds, Systems modeling, Data processing, Data acquisition, CCD cameras, Artificial intelligence, Aerospace engineering

SPIE Journal Paper | 17 February 2021 Open Access
OE, Vol. 60, Issue 02, 020903, (February 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.2.020903
KEYWORDS: 3D metrology, LCDs, Fringe analysis, Deflectometry, Calibration, Error analysis, Reflectivity, Imaging systems, Cameras, Optical engineering

Showing 5 of 51 publications
Conference Committee Involvement (17)
Optical Metrology and Inspection for Industrial Applications XII
11 October 2025 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications XIV
16 April 2025 | Orlando, Florida, United States
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Showing 5 of 17 Conference Committees
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