Dr. Haruhiko Ohashi
at Japan Synchrotron Radiation Research Institute
SPIE Involvement:
Conference Program Committee | Editor | Author
Publications (52)

Proceedings Article | 6 October 2023 Presentation
Proceedings Volume PC12697, PC1269702 (2023) https://doi.org/10.1117/12.2678528
KEYWORDS: X-rays, X-ray optics, X-ray lasers, Synchrotron radiation, Phase distribution, Partial coherence, Mirrors, Free electron lasers

Proceedings Article | 4 October 2023 Presentation
Haruhiko Ohashi, Hirokatsu Yumoto, Takahisa Koyama, Yasunori Senba, Hiroshi Yamazaki, Koji Tsubota, Satsuki Shimizu, Takamitsu Saito, Hikaru Kishimoto, Masayuki Tanaka, Yasuhiro Shimizu, Takaihsa Matsuzaki, Takanori Miura
Proceedings Volume PC12695, PC1269506 (2023) https://doi.org/10.1117/12.2682568
KEYWORDS: Metrology, Optical components, Distortion, Wavefronts, Thermal deformation, Simulations, Optical surfaces, Mirrors, Light sources, Crystals

Proceedings Article | 3 October 2023 Presentation + Paper
T. Kume, Y. Matsuzawa, T. Saito, K. Hiraguri, Y. Takeo, T. Kimura, H. Kishimoto, Y. Senba, H. Ohashi, H. Mimura, H. Hashizume
Proceedings Volume 12694, 1269408 (2023) https://doi.org/10.1117/12.2677302
KEYWORDS: Mirrors, X-rays, Fabrication

Proceedings Article | 4 October 2022 Presentation + Paper
T. Kume, Y. Matsuzawa, K. Hiraguri, Y. Takeo, T. Kimura, H. Kishimoto, Y. Senba, H. Ohashi, H. Hashizume, H. Mimura
Proceedings Volume 12240, 122400G (2022) https://doi.org/10.1117/12.2633765
KEYWORDS: Mirrors, X-rays, Profilometers, Stitching interferometry

Proceedings Article | 4 October 2022 Presentation + Paper
Proceedings Volume 12240, 1224004 (2022) https://doi.org/10.1117/12.2632949
KEYWORDS: Silicon, X-rays, Luminescence, Mirrors, X-ray fluorescence spectroscopy, Sensors, Aluminum, Fluorine, Fluorescence spectroscopy

Showing 5 of 52 publications
Proceedings Volume Editor (6)

SPIE Conference Volume | 24 October 2023

SPIE Conference Volume | 18 September 2020

SPIE Conference Volume | 4 October 2019

SPIE Conference Volume | 27 October 2017

SPIE Conference Volume | 5 December 2016

Showing 5 of 6 publications
Conference Committee Involvement (16)
Advances in Metrology for X-Ray and EUV Optics XI
3 August 2025 | San Diego, California, United States
Advances in X-Ray/EUV Sources, Optics, and Components XX
3 August 2025 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XIX
19 August 2024 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics X
23 August 2023 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XVIII
22 August 2023 | San Diego, California, United States
Showing 5 of 16 Conference Committees
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